The FIB is normally configured with a TEM-style goniometer specimen introduction system ... Larger specimens can be accommodated in an SEM stage, although advance scheduling will be required for use ...

There are many sample preparation techniques for TEM investigation; however, only FIB-SEM preparation provides the precision, final quality, and site-specific requirements for samples subject to ...

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research ... high-resolution S/TEM sample preparation for ...

Image Credit: TESCAN USA Inc. A 30 μm thick crystalline SiC layer on a Si substrate was utilized to show TEM specimen ...

New system, same great performance: Remove hydrocarbons on TEM and SEM samples that may impact analysis. Minimize surface damage and maintain the integrity of silicon Play Minimize surface damage ...

Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector ... beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) ...

The FIB-SEM offers 30% better SEM resolution at low voltage ... FIB scanning strategies for material removal can benefit users. Batches of samples, like TEM lamellae, cross-sections, or any ...

Furthermore, a choice of software modules, wizards and recipes make FIB-SEM applications an easy and straightforward experience for both novice and expert users.

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a powerful pre-configured high-end FIB-SEM, enables fully-automated and unattended preparation of TEM samples in the semiconductor lab. Obtain optimal sample quality and automation reliability with ...