The 7500 represents a fresh look at Broad Ion Beam Milling. The system is designed around our new 50 cm plasma source and a new high reliability rotary substrate table. The ion source is the ...

What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...

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The Triple Ion Beam Milling System, EM TIC 3X, enables the fabrication of cross sections and planar surfaces for Microstructure Analysis (EDS, WDS, Auger, EBSD), AFM, and Scanning Electron Microscopy ...

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The CP-8000+ from COXEM is a sophisticated sample preparation tool that helps etch a cross-section of a sample with the help of an argon ion beam. This process prevents structural damage and physical ...

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