This library contains most of the available experimental nuclear cross-sections relevant to ion beam analysis. Excitation functions are presented both as graphs and data files. Data collection is a ...

Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It enables the creation of ...

Hitachi High-Tech Europe This study demonstrates that using the Broad Ion Beam milling approach with Ar can greatly enhance the surface of crystalline materials, preparing them for EBSD analysis.