The global effort to combat climate change requires expanding renewable energy technologies. To optimise solar cells, ...

ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS ...

Department of Materials Science and Chemical Engineering, Hanyang University, Ansan 15588, Republic of Korea Department of Materials Science and Engineering, Korea Advanced Institute of Science and ...

X-Ray Microscopy (XRM) and Focused Ion Beam Scanning Electron ... and mean sample decomposition can be calculated. Image Credit: Carl Zeiss Raw Materials A large field of view area of the washcoat was ...

Attribution (BY): Credit must be given to the creator. Transmission electron microscopy (TEM) is well-known for performing in situ studies in the nanoscale. Hence, scientists took this opportunity to ...

Royalty-free licenses let you pay once to use copyrighted images and video clips in personal and commercial projects on an ongoing basis without requiring additional payments each time you use that ...

由于设计有缺陷，因此，只要切断从保护熔丝到其它电路的某一根信号线（或切割掉整个加密电路）或连接1～3根金线（通常称 FIB：focused ion beam)，就能禁止整个保护功能，这样使用简单的编程器就能直接读出程序存储器的内容。 虽然大多数普通单片机都具有熔 ...

Using focused ion beam milling, cryo-electron tomography, and advanced AI-based image analysis, the authors compellingly demonstrate that the macromolecular organization in spinach thylakoids closely ...

Using focused ion beam milling and electron cryo-tomography ... A few individual sporozoites are coloured consistently in all three images. Middle: SEM image during the FIB-milling process. Right: SEM ...