This enables users to select the ions that offer the best outcomes for their samples and use cases, like transmission electron microscopy (TEM) and scanning transmission ... to offer the latest ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

The technique involves directing a focused beam of electrons onto a sample and ... thanks to the fine electron probe it utilizes. Scanning Transmission Electron Microscopy (STEM) and Transmission ...

Thermo Scientific Scios 2 Dual-beam Focus Ion Beam/ Scanning Electron Microscope (DB FIB/SEM) equipped with ...

A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a ...

Figure 6: Phase space for operation of a scanning electron microscope at a fixed source brightness. Such new source designs may well halve the energy spread while doubling beam brightness.