This enables users to select the ions that offer the best outcomes for their samples and use cases, like transmission electron microscopy (TEM) and scanning ... inventive multi-ion-species plasma FIB ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt Low-background EDS Holder Gatan 626 ...

The technique involves directing a focused beam of electrons onto a sample and detecting the electrons ... STEM is capable of producing images with spatial resolution down to the atomic level, thanks ...

A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a ...

Figure 6: Phase space for operation of a scanning electron microscope at a fixed source brightness. Such new source designs may well halve the energy spread while doubling beam brightness.