It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...

FIB milling relies on the interaction between a focused beam of ions and the sample surface. The most commonly used ion source is liquid metal ion source (LMIS), typically gallium (Ga +), due to its ...

This webinar will show a “fairly new” technology for micro and nano fabrication and characterization. It will discuss the Focused Ion Beam (FIB) technology, a tool available on the market from the ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

According to Cha, by having a focused ion beam on campus, scientists at Yale will not only save time but also be able to perform better research. “The commute put so much strain on researchers,” Cha ...

This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results ...