(Image: Wikipedia Commons ... adoption of FIB in various research and industrial settings. Micron, A review of focused ion beam milling techniques for TEM specimen preparation Journal of ...

focused ion beam microscopy combined with transmission electron microscopy, to gain detailed information about the crystalline structure of new perovskite materials. Until Uchida’s image was ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...