What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them ...

Its fusion of industry-leading focused ion beam and electron beam performance, along with exclusive software and automation, ensures ease of use and precision for SEM imaging, FIB etching/deposition .

The Hitachi FB-2000A FIB uses a beam of focused high-energy ... Control of the ion beam is gained through the Unix workstation and fabrication software system that is designed to support both TEM ...

The Thermo Scientific™ Aquilos™ 2 Cryo-FIB is the first cryo-DualBeam™ (focused ion beam/scanning electron microscope ... imaging in a cryo-transmission electron microscope (cryo-TEM). JEOL 2200FS ...

NanoBuilder Software enables the precise design of intricate and large-scale nanostructures across various locations, accommodating the entire range of DualBeam (focused ion beam scanning electron ...