Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The IB-19530CP Ion Beam Cross Section ...

The CP-8000+ from COXEM is a sophisticated sample preparation tool that helps etch a cross-section of a sample with ... Image Credit: COXEM Co., Ltd. Ar Ion Milling System. Image Credit: COXEM Co., ...

Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It enables the creation of ...