Much like the traditional scanning electron microscope (SEM), the field emission scanning electron microscope uses electrons to illuminate a sample, instead of visible light as is used in optical ...

At the 9th International Symposium on Functional π-Electron Systems (F-π-9) 2010, which took place at Georgia Tech in Atlanta, United States, the atmosphere was that of scientific excitement ...

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

Figuring out certain aspects of a material's electron structure can take a lot ... Qiu and her team decided to focus on the electrons' wave function, which mathematically describes the quantum ...

It identified a second fundamental function of complex I ... specifically impairs proton-sodium exchange without affecting electron transport or proton pumping via the complex.

Hiroshi Kawamoto, Division Officer, Finance Division of Tokyo Electron Limited (TEL), one of Japan's leading semiconductor ...