Scanning Electron Microscopes (SEM) are microscopes that employ a targeted beam of electrons on a sample surface to produce an image. With the use of accessories, SEMs can be highly-versatile tools of ...

Topics covered can be split into four major groups: safety, specification languages, concepts of software engineering, different methods of software testing. A substantial amount of time will be spent ...

Bruker Nano Surfaces and Metrology The PI 89 allows researchers to conduct in-situ nanomechanical testing inside an SEM from extremely low to high loads while providing exceptional environmental ...