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SEM和TEM的相同点和不同点
扫描电镜(SEM)使用一组特定的线圈以光栅样式扫描样品,并收集散射的电子,放大再成像对样品表面或者断口形貌进行观察和分析。 透射电镜(TEM) 而透射电镜(TEM)是以电子束透过样品经过聚焦与放大后所成的物像,因此,透射电镜(TEM)观察的是样品的内部 ...
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