What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...

The 7500 represents a fresh look at Broad Ion Beam Milling. The system is designed around our new 50 cm plasma source and a new high reliability rotary substrate table. The ion source is the ...

The latest EM TIC 3X’s doubled ion milling rate can be further improved with the choice of five distinct stages that are tailored to the application’s needs. The Triple Ion Beam Milling System, EM TIC ...

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At the time of milling, the sample is automatically rocked to prevent the appearance of beam striations on the cross-sectioned surface. Due to the glancing incidence of the ion beam, argon is not ...

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