In this paper, the use of an oxygen primary ion source for positive and negative secondary ion detection is being investigated on an in-line SIMS tool. We evaluate sensitivity levels of detecting ...

The Ion Beam Milling ion-etching process is vacuum based and is dependent on precise identification of interlayer breakthrough through multiple stacked thin-film layers each of perhaps only a few ...

Meyer presented results from FLUKA Monte Carlo simulations comparing proton, helium-ion and carbon-ion CT for proton therapy planning. He described the simulation of ion-CT images at 2 mGy physical ...

These were originally gallium FIBs, moving to plasma FIBs more recently. The most recent tool is the broad argon beam, also called the broad ion beam, because it is possible to use ions other than ...

The 7500 represents a fresh look at Broad Ion Beam Milling. The system is designed around our new 50 cm plasma source and a new high reliability rotary substrate table.

Ion beam lithography is used to create fine nanostructures on a surface, such as circuit boards. It can be used to directly write on the material, rather than using a photomask, as in ...

Nano-dunes with the ion beam New method for self-organized nanostructures studied Date: September 8, 2015 Source: Helmholtz-Zentrum Dresden-Rossendorf Summary: Many semiconductor devices in modern ...

The ion beam comes from the left, and most particles stop before they hit the mouse’s spine (imaged with a CT scan). Giulio Lovatti/LMU By Emily Conover October 11, 2024 at 9:00 am ...

New York, Jan. 02, 2023 (GLOBE NEWSWIRE) -- Reportlinker.com announces the release of the report "Focused Ion Beam Market by Ion Source, Application, Vertical and Region - Global Forecast to 2028 ...