AZOM4 年
The NX5000: A Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
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AZOM3 年
Focused Ion Beam Scanning Electron Microscope — Helios Hydra DualBeam
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...
News Medical2 年
Piezoelectric vibration cancellation with the SEM-Base VI
SEM-Base VI has been developed to aid all commercial Scanning Electron Microscopes (SEMs), as well as several Small Dual Beam and Focused Ion Beam (FIB) instruments. SEM-Base VI offers enhanced ...