(Image: Wikipedia Commons, CC0 1.0) FIB milling relies on the interaction between a focused beam of ions and the sample surface. The most commonly used ion source is liquid metal ion source (LMIS), ...

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Focused Ion Beam (FIB) systems utilize a finely focused beam of gallium ions operated at low-beam currents for imaging and at high-beam currents for site-specific milling. Their versatility makes them ...

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The ion source can be used in monatomic mode for ... in the focusing column then removes energetic neutrals. The beam is then focused to a minimum spot size of 250 μm on the sample.