We demonstrate, by cryo-electron tomography of Escherichia coli cells, that a focused ion beam (FIB) can be used to thin whole frozen-hydrated cells in a convenient and essentially artifact-free way.

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

Electron beam resolution: At optimum WD: 0.7 nm at 1 kV; 1.0 nm at 500 V (ICD) At coincident point: 0.6 nm at 15 kV; 1.2 nm at 1 kV; Electron beam parameter space: Electron beam current range: 0.8 pA ...

Unique Images with Ion-beam Scanning Electron Microscopy. The investigation focused in particular on the initial lithium deposition in the pores below the surface that are not visible from the outside ...

Study: Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging.Image Credit: White_Fox/Shutterstock.com. In an article recently published in the journal ...

NanoBuilder Software enables the precise design of intricate and large-scale nanostructures across various locations, accommodating the entire range of DualBeam (focused ion beam scanning electron ...

The NX500 is a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) offering unparalleled performance with precise 3D volume microscopy and cross-sectioning ... —called NX5000—that enables ...

Pengfei Zhang, Shuangfang Lu, Junqian Li, Xiangchun Chang, Jijun Li, Wenbiao Li, Guo Chen, Siyuan Wang, Wenjun Feng, Broad ion beam-scanning electron microscopy pore microstructure and multifractal ...

Thermo Fisher Scientific Inc., the world leader in serving science, today unveiled the Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB), a n ...

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...