Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

The built-in Ar + /Xe + beam helps prepare uniform, ultra-thin, low damage TEM lamellae easily, even on the most complex materials.

The technique involves directing a focused beam of electrons onto a sample and detecting the electrons ... STEM is capable of producing images with spatial resolution down to the atomic level, thanks ...

FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt Low-background EDS Holder Gatan 626 ...

A Scanning Electron Microscope uses a targeted beam of high-energy electrons on a test sample to produce an image or detect specific details. Electron-sample interactions can reveal a lot about a ...

Much like the traditional scanning ... field emission electron microscopy, however, an electric field is applied to the tip of the electron source essentially "pulling" electrons from the emitter. The ...

Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning. Zeiss Crossbeam 550 with GEMINI II electron ...

Electron microscopy uses a beam of electrons to illuminate a sample ... an image of the internal structure of a thin sample. Scanning electron microscopy generates a topological image of a sample.