We demonstrate, by cryo-electron tomography of Escherichia coli cells, that a focused ion beam (FIB) can be used to thin whole frozen-hydrated cells in a convenient and essentially artifact-free way.

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

Electron beam resolution: At optimum WD: 0.7 nm at 1 kV; 1.0 nm at 500 V (ICD) At coincident point: 0.6 nm at 15 kV; 1.2 nm at 1 kV; Electron beam parameter space: Electron beam current range: 0.8 pA ...

Study: Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging.Image Credit: White_Fox/Shutterstock.com. In an article recently published in the journal ...

Unique Images with Ion-beam Scanning Electron Microscopy. The investigation focused in particular on the initial lithium deposition in the pores below the surface that are not visible from the outside ...

Thermo Fisher Scientific Inc., the world leader in serving science, today unveiled the Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB), a n ...

NanoBuilder Software enables the precise design of intricate and large-scale nanostructures across various locations, accommodating the entire range of DualBeam (focused ion beam scanning electron ...

Scanning Electron Microscopy (SEM) is a type of electron microscopy that uses a focused beam of high-energy electrons to generate detailed images of the surface of solid specimens. These images can ...

The NX500 is a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) offering unparalleled performance with precise 3D volume microscopy and cross-sectioning ... —called NX5000—that enables ...