FIB milling relies on the interaction between a focused beam of ions and the sample surface. The most commonly used ion source is liquid metal ion source (LMIS), typically gallium (Ga +), due to its ...

This webinar will show a “fairly new” technology for micro and nano fabrication and characterization. It will discuss the Focused Ion Beam (FIB) technology, a tool available on the market from the ...

Structures can float by interrupting their grounding with the ion beam (not shown here). They can be grounded via ion beam cutting and subsequent ion beam-induced metal deposition. The ZEISS Crossbeam ...

According to Cha, by having a focused ion beam on campus, scientists at Yale will not only save time but also be able to perform better research. “The commute put so much strain on researchers,” Cha ...

This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results ...