Elsewhere, when precise positioning of the cross-section is necessary a Focused Ion Beam (FIB) System is used, such as in the case of stacks of thin films or micro area specimen preparation. Yet, the ...

• Focused ion beam (FIB) pattern writing with Nanopatterning & Visualization Engine (NPVE) • Precise preparation of cross-sectional samples for transmission electron microscopy (TEM) • 3D tomography: ...

COXEM's CP-8000+ is a powerful cross section polishing tool that uses an argon ion beam to allow precise, advanced sample preparation. Its state-of-the-art technology means the sample is not deformed ...

Processing materials on the nanoscale, producing prototypes for microelectronics or analyzing biological samples: The range of applications for finely focused ion beams is huge. Experts from the ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

Posted: Jul 11, 2016: New focused ion beam strengthens nanotechnology and high-pressure science (Nanowerk News) A new “nano scalpel” enables scientists at DESY to prepare samples or materials with ...

Surface milling and polishing, cross-section polishing as well as carbon or metal sputter coating are now possible within one instrument, using specialized functional holders. “JEOL has been a pioneer ...

Focused ion beams or FIB are generated to focus on the point source’s image by using electrostatic lenses onto a substrate and then its precise deflection. These beams usually have a diameter ...