Focused ion beams or FIB are generated to focus on the point source’s image by using electrostatic lenses onto a substrate and then its precise deflection. These beams usually have a diameter ...

Processing materials on the nanoscale, producing prototypes for microelectronics or analyzing biological samples: The range of applications for finely focused ion beams is huge. Experts from the ...

Elsewhere, when precise positioning of the cross-section is necessary a Focused Ion Beam (FIB) System is used, such as in the case of stacks of thin films or micro area specimen preparation. Yet, the ...

The growth can be attributed to the increased use of the FIB-SEM in research laboratories to improve the quality and performance of products used in various industries, including automotive ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

COXEM's CP-8000+ is a powerful cross section polishing tool that uses an argon ion beam to allow precise, advanced sample preparation. Its state-of-the-art technology means the sample is not deformed ...

Surface milling and polishing, cross-section polishing as well as carbon or metal sputter coating are now possible within one instrument, using specialized functional holders. “JEOL has been a pioneer ...

Posted: Jul 11, 2016: New focused ion beam strengthens nanotechnology and high-pressure science (Nanowerk News) A new “nano scalpel” enables scientists at DESY to prepare samples or materials with ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...