The Orage™ Ga+ FIB column was designed to meet increasingly stringent focused ion beam nanofabrication requirements. With its ultimate FIB resolution, a broad range of beam current choices and ...
by combining the high-throughput i-FIB+™ Xe plasma FIB column with the next generation tripleobjective Triglav™ electron column. Xe plasma FIB milling enables large-volume bulk material removal ...
The column resembles that of an electron microscope and functions ... The FB-2000A can be considered a micro/nano machine shop. The FIB is normally configured with a TEM-style goniometer specimen ...
The FIB column of the ZEISS Crossbeam Family is uniquely equipped with a beam current of 100 nA. This trench is milled in silicon, dimensions 100 × 30 × 25 μm³, milling time 10 minutes using 100 nA ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology ... using the groundbreaking Phoenix Ion Column with unmatched ...
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