当您对样品进行扫描时，无论设置实验参数为扫描速度 > 125Hz，还是在大气下或者溶液中1秒获得一张AFM图像，都能得到优异的高分辨图像。快速扫描这一变革性的技术创新重新定义了AFM仪器的 ...
但是，金膜溅射沿垂直方向的不连续和自身纳米晶粒结构，导致SEM图像不能提供沿样品垂直方向的信息也不适用于某些纳米结构材料，并且分辨率 ...
One of the most important acronyms in nanotechnology is AFM – Atomic Force Microscopy. This instrument has become the most widely used tool for imaging, measuring and manipulating matter at the ...
It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...
ASTRON Inc. 上图是AFM5500M拍摄的形状像（AFM像）和电位像（KFM像）分别和SEM图像叠加的应用数据。 通过分析AFM图像可以判断，SEM对比度表征石墨烯层的厚薄。 石墨烯层数不同导致表面电位（功函数 ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
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